Crack Tip dislocations Observed by High-Voltage Electron-Microscopy in Single Crystal Silicon

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	Proceedings of 16th International Microscopy Congress, Publication committee of IMC16
Pages	1110
Number of pages	1
Publication status	Published - 2006

Cite this

@inproceedings{d7e236b8db6b4879a4e30dc801513daf,

title = "Crack Tip dislocations Observed by High-Voltage Electron-Microscopy in Single Crystal Silicon",

author = "Kenji Higashida and Masaki Tanaka",

year = "2006",

language = "English",

pages = "1110",

booktitle = "Proceedings of 16th International Microscopy Congress, Publication committee of IMC16",

}