An experiment is presented to clarify the correlation between temperature fluctuations in silicon melt and impurity concentration in grown silicon crystals. Fluctuations in temperature and concentration show a correlation in the frequency domain according to the results of fast Fourier transform analysis. The intrinsic instability of silicon convection, which includes fluctuations in temperature, affected the fluctuation in impurity concentration.
All Science Journal Classification (ASJC) codes
- Condensed Matter Physics
- Inorganic Chemistry
- Materials Chemistry