TY - JOUR
T1 - Computed tomography reconstruction from two transmission measurements for iodine-marked cancer detection
AU - Kanno, Ikuo
AU - Shima, Kazunari
AU - Shimazaki, Hironobu
AU - Yamashita, Yoshiki
AU - Watanabe, Kenichi
AU - Ohtaka, Masahiko
AU - Hashimoto, Makoto
AU - Ara, Kuniaki
AU - Onabe, Hideaki
N1 - Funding Information:
This work was supported by a grant-in-aid for Scientific Research from the Japan Society for the Promotion of Science and by the Suzuken Memorial Foundation.
PY - 2013/10/1
Y1 - 2013/10/1
N2 - The authors invented the transXend detector, which measures X-rays as electric currents, and then gives the energy distribution of the X-rays after an unfolding process. In a previous paper, it was shown that the material thickness distributions can be estimated with the transXend detector by using reference points plotted from the electric current ratios, such as the I 2/I 1-I 3/I 1 graph, where I i denotes the electric current measured by the i-th segment of the transXend detector. In this paper, the tomographic images of iodine, aluminum, and the acrylic those surround the other two materials are reconstructed from their material thickness distributions, which are estimated from two X-ray incidence directions. The X-ray event ratios are also used to estimate the material thickness distributions.
AB - The authors invented the transXend detector, which measures X-rays as electric currents, and then gives the energy distribution of the X-rays after an unfolding process. In a previous paper, it was shown that the material thickness distributions can be estimated with the transXend detector by using reference points plotted from the electric current ratios, such as the I 2/I 1-I 3/I 1 graph, where I i denotes the electric current measured by the i-th segment of the transXend detector. In this paper, the tomographic images of iodine, aluminum, and the acrylic those surround the other two materials are reconstructed from their material thickness distributions, which are estimated from two X-ray incidence directions. The X-ray event ratios are also used to estimate the material thickness distributions.
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U2 - 10.1080/00223131.2013.830077
DO - 10.1080/00223131.2013.830077
M3 - Article
AN - SCOPUS:84884583695
SN - 0022-3131
VL - 50
SP - 1020
EP - 1033
JO - journal of nuclear science and technology
JF - journal of nuclear science and technology
IS - 10
ER -
