Abstract
Time evolution of interfacial thicknesses between a cyclic polystyrene (c-hPS) / its deuterated counterpart (c-dPS) and a linear polystyrene (1-hPS) / its deuterated counterpart (1-dPS) bilayer films was investigated by dynamic secondary ion mass spectrometry (DSIMS) and neutron reflectivity (NR). The interfacial thickness of (c-hPS/c-dPS) film was significantly larger than that of (1-hPS/1-dPS) film at any given annealing time, indicating that the diffusion constant of c-PS is constantly larger than that of 1-PS. It might be explained that weaker topological constraint comes from the entanglement for the c-PS than for the 1-PS.
Original language | English |
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Pages | 3131-3132 |
Number of pages | 2 |
Publication status | Published - 2006 |
Event | 55th Society of Polymer Science Japan Symposium on Macromolecules - Toyama, Japan Duration: Sept 20 2006 → Sept 22 2006 |
Other
Other | 55th Society of Polymer Science Japan Symposium on Macromolecules |
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Country/Territory | Japan |
City | Toyama |
Period | 9/20/06 → 9/22/06 |
All Science Journal Classification (ASJC) codes
- Engineering(all)