Abstract
Time evolution of interfacial thicknesses between a cyclic polystyrene (c-hPS) / its deuterated counterpart (c-dPS) and a linear polystyrene (1-hPS) / its deuterated counterpart (1-dPS) bilayer films was investigated by dynamic secondary ion mass spectrometry (DSIMS) and neutron reflectivity (NR). The interfacial thickness of (c-hPS/c-dPS) film was significantly larger than that of (1-hPS/1-dPS) film at any given annealing time, indicating that the diffusion constant of c-PS is constantly larger than that of 1-PS. It might be explained that weaker topological constraint comes from the entanglement for the c-PS than for the 1-PS.
| Original language | English |
|---|---|
| Pages | 2843 |
| Number of pages | 1 |
| Publication status | Published - 2005 |
| Event | 54th SPSJ Symposium on Macromolecules - Yamagata, Japan Duration: Sept 20 2005 → Sept 22 2005 |
Other
| Other | 54th SPSJ Symposium on Macromolecules |
|---|---|
| Country/Territory | Japan |
| City | Yamagata |
| Period | 9/20/05 → 9/22/05 |
All Science Journal Classification (ASJC) codes
- General Engineering
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