Characteristics of Tc and ρ(T) of polycrystalline (In 2O3)-(ZnO) films with low carrier density

B. Shinozaki, S. Takada, N. Kokubo, K. Makise, T. Asano, K. Yamada, K. Yano, H. Nakamura

Research output: Contribution to journalConference articlepeer-review


For the polycrystalline (In2O3)-(ZnO) prepared by annealing in air, we investigated the relation among superconductivity, ρ(T) characteristics and preparation conditions. To clarify the distribution of elements, we studied the microstructure by scanning transmission electron microscopy (STEM) and electron energy-loss spectroscopy (EELS). It was found that 1) The films annealed at restricted regions of annealing temperature T a and time ta show the superconductivity. Transition temperature Tc and carrier density n are Tc<3.3K and n ≈1025/m3∼1026/m3, respectively. 2) The data on EELS spectra mapping of indium plasmon indicate that droplets of the pure indium phase distribute discretely on grain boundaries and near the interface between the film and the glass substrate. 3) Although data in the Tc - Ta relation are scattered, the T c shows relatively good correlation with n, taking a convex form.

Original languageEnglish
Article number022107
JournalJournal of Physics: Conference Series
Issue numberPART 2
Publication statusPublished - 2012
Event26th International Conference on Low Temperature Physics, LT 2011 - Beijing, China
Duration: Aug 10 2011Aug 17 2011

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)


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