Channelling-enhanced microanalysis using [111] and [001] zone-axis beam incidence for L12-type Ni3(Al, Ta)

Z. Horita, M. R. McCartney, H. Kuninaka

    Research output: Contribution to journalArticlepeer-review

    7 Citations (Scopus)


    Site occupancy has been determined using the channelling-enhanced microanalysis for a Ni3(Al, Ta) intermetallic compound with the L12-type crystal structure. It is shown that there is a large scattering of data points for [001] beam incidence compared with [111] beam incidence. The reasons for this difference are examined by simulating channelling electron distribution on the A1 and Ni columns. It is concluded that the large scattering for the [001] beam incidence is due to the indistinguishable difference between channelling electron intensities on the A1 and Ni columns.

    Original languageEnglish
    Pages (from-to)153-167
    Number of pages15
    JournalPhilosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
    Issue number1
    Publication statusPublished - Jan 1997

    All Science Journal Classification (ASJC) codes

    • Electronic, Optical and Magnetic Materials
    • General Materials Science
    • Condensed Matter Physics
    • Physics and Astronomy (miscellaneous)
    • Metals and Alloys


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