Abstract
The temperature dependence of 0.2% proof stress was investigated in Ti0.49 mass%O with an ¡ single phase. The 0.2% proof stress decreased as the temperature increased from 77 to 573 K. The athermal stress, which was defined as the average of the stress values for which the temperature dependence was absent above 573 K, was found to be 70 MPa. The temperature dependence of the effective stress indicates that the temperature dependence of the effective stress changed at around 400 K. To study the thermally activated process that controls the yielding in Ti, the temperature dependence of the activation volume was also measured. An inverse temperature dependence of the activation volume was found at between 325 and 400 K, suggesting that the thermally activated process of dislocation glide changed at this temperature.
Original language | English |
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Pages (from-to) | 80-85 |
Number of pages | 6 |
Journal | Materials Transactions |
Volume | 60 |
Issue number | 1 |
DOIs | |
Publication status | Published - 2019 |
All Science Journal Classification (ASJC) codes
- General Materials Science
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering