Atom locations in a Ni doped η-(Cu,Ni)6Sn5 intermetallic compound

Wenhui Yang, Tomokazu Yamamoto, Kohei Aso, Flora Somidin, Kazuhiro Nogita, Syo Matsumura

Research output: Contribution to journalArticlepeer-review

16 Citations (Scopus)


The present study has succeeded in direct determination of the location of dopant Ni atoms in η-(Cu,Ni)6Sn5 by aberration-corrected scanning transmission electron microscopy (STEM) including atomic-resolution imaging as well as elemental mapping by X-ray energy-dispersive spectroscopy (XEDS). The three sublattices of Sn, Cu1 and Cu2 were distinguished in atomic-resolution images observed along the [21¯1¯0] direction. Atomic-resolution XEDS maps have verified for the first time that the dopant Ni atoms located at the Cu2 sites in η-(Cu,Ni)6Sn5, taking advantage of the Poisson non-local principal component analysis (NLPCA) processing and the lattice-averaging procedure.

Original languageEnglish
Pages (from-to)1-5
Number of pages5
JournalScripta Materialia
Publication statusPublished - Jan 1 2019

All Science Journal Classification (ASJC) codes

  • General Materials Science
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys


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