TY - JOUR
T1 - Application of synchrotron radiation x-ray scattering and spectroscopy to soft matter
AU - Takahara, Atsushi
AU - Higaki, Yuji
AU - Hirai, Tomoyasu
AU - Ishige, Ryohei
N1 - Funding Information:
Funding: This work was supported by Photon and Quantum Basic Research Coordinated Development Program from the Ministry of Education, Culture, Sports, Science, and Technology, Japan and JSR/ERATO Takahara Soft-interface Project. We also acknowledge support from the World Premier International Research Center Initiative (WPI) MEXT, Japan, and the Cooperative Research Program of “Network Joint Research Center for Materials and Devices.” Part of this work was supported by the Impulsing Paradigm Change through Disruptive Technologies (ImPACT) Program.
Funding Information:
This work was supported by Photon and Quantum Basic Research Coordinated Development Program from the Ministry of Education, Culture, Sports, Science, and Technology, Japan and JSR/ERATO Takahara Soft-interface Project. We also acknowledge support from the World Premier International Research Center Initiative (WPI) MEXT, Japan, and the Cooperative Research Program of "Network Joint Research Center for Materials and Devices. " Part of this work was supported by the Impulsing Paradigm Change through Disruptive Technologies (ImPACT) Program. We would like to acknowledge Z.-B. Guan (University of California Irvine) for supplying colloidal crystal elastomer samples. Also, collaboration with Y. Harada and K. Yamazoe (University of Tokyo), K. Kamtani (Aichi Synchrotron Radiation Center), and T. Hoshino (Riken Spring-8 Center) were greatly acknowledged. The X-ray diffraction measurements were performed at the BL02B2 and BL40B2 beam lines of SPring-8 under the proposal numbers 2013B1447, 2013B1171, 2014A1250, 2014A1228, 2014A1222, 2014B1198, 2014B1286, 2014B1285, 2015A1588, 2015A1514, 2015A1582, 2015B1459, 2015B1325, 2015B1514, 2015B1188, and 2016B1227. GIWAXD experiments using tender X-ray were performed at the Kyushu University Beam line in SAGA-LS under the proposal numbers 2014IIIKN009, 2015IK008, 2015IIK006, 2015IIIK003, and 2016IK009.
Publisher Copyright:
© 2020 by the authors.
PY - 2020/7
Y1 - 2020/7
N2 - Light produced by synchrotron radiation (SR) is much brighter than that produced by conventional laboratory X-ray sources. The photon energy of SR X-ray ranges from soft and tender X-rays to hard X-rays. Moreover, X-rays become element sensitive with decreasing photon energy. By using a wide energy range and high-quality light of SR, different scattering and spectroscopic methods were applied to various soft matters. We present five of our recent studies performed using specific light properties of a synchrotron facility, which are as follows: (1) In situ USAXS study to understand the deformation behavior of colloidal crystals during uniaxial stretching; (2) structure characterization of semiconducting polymer thin films along the film thickness direction by grazing-incidence wide-angle X-ray scattering using tender X-rays; (3) X-ray absorption fine structure (XAFS) analysis of the formation mechanism of poly(3-hexylthiophene) (P3HT); (4) soft X-ray absorption and emission spectroscopic analysis of water structure in polyelectrolyte brushes; and (5) X-ray photon correlation spectroscopic analysis of the diffusion behavior of polystyrene-grafted nanoparticles dispersed in a polystyrene matrix.
AB - Light produced by synchrotron radiation (SR) is much brighter than that produced by conventional laboratory X-ray sources. The photon energy of SR X-ray ranges from soft and tender X-rays to hard X-rays. Moreover, X-rays become element sensitive with decreasing photon energy. By using a wide energy range and high-quality light of SR, different scattering and spectroscopic methods were applied to various soft matters. We present five of our recent studies performed using specific light properties of a synchrotron facility, which are as follows: (1) In situ USAXS study to understand the deformation behavior of colloidal crystals during uniaxial stretching; (2) structure characterization of semiconducting polymer thin films along the film thickness direction by grazing-incidence wide-angle X-ray scattering using tender X-rays; (3) X-ray absorption fine structure (XAFS) analysis of the formation mechanism of poly(3-hexylthiophene) (P3HT); (4) soft X-ray absorption and emission spectroscopic analysis of water structure in polyelectrolyte brushes; and (5) X-ray photon correlation spectroscopic analysis of the diffusion behavior of polystyrene-grafted nanoparticles dispersed in a polystyrene matrix.
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U2 - 10.3390/polym12071624
DO - 10.3390/polym12071624
M3 - Review article
AN - SCOPUS:85088651382
SN - 2073-4360
VL - 12
JO - Polymers
JF - Polymers
IS - 7
M1 - 1624
ER -