Application of local tomography technique to high-resolution synchrotron X-ray imaging

Tomomi Ohgaki, Hiroyuki Toda, Kentaro Uesugi, Toshiro Kobayashi, Koichi Makii, Toshiaki Takagi, Yasuhiro Aruga

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

X-ray CT method is a kind of nondestructive inspection, but has strong limitation in sample size due to a small field of view (FOV). The higher the resolution, the smaller FOV is, mainly due to the element number of available detectors commercially. Therefore, sample machining is more or less necessary so that the sample size is fit within the small FOV in the case of the high-resolution observation. Local tomography technique enables a high resolution reconstruction of small region of interests within a sample without the sample machining. In this study, we have evaluated the size effects of aluminum foam samples in terms of the 3D image quality by the local tomography techniques.

Original languageEnglish
Title of host publicationSupplement to THERMEC 2006, 5th International Conference on PROCESSING and MANUFACTURING OF ADVANCED MATERIALS, THERMEC 2006
PublisherTrans Tech Publications Ltd
Pages287-292
Number of pages6
EditionPART 1
ISBN (Print)0878494286, 9780878494286
DOIs
Publication statusPublished - 2007
Externally publishedYes
Event5th International Conference on Processing and Manufacturing of Advanced Materials - THERMEC'2006 - Vancouver, Canada
Duration: Jul 4 2006Jul 8 2006

Publication series

NameMaterials Science Forum
NumberPART 1
Volume539-543
ISSN (Print)0255-5476
ISSN (Electronic)1662-9752

Other

Other5th International Conference on Processing and Manufacturing of Advanced Materials - THERMEC'2006
Country/TerritoryCanada
CityVancouver
Period7/4/067/8/06

All Science Journal Classification (ASJC) codes

  • General Materials Science
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Fingerprint

Dive into the research topics of 'Application of local tomography technique to high-resolution synchrotron X-ray imaging'. Together they form a unique fingerprint.

Cite this