TY - JOUR
T1 - Application of a laboratory xafs spectrometer to characterization of aluminium in an amorphous aluminosilicate
AU - Ikeda, Yoshio
AU - Yokoyama, Takushi
AU - Yamashita, Seiichi
AU - Wakita, Hisanobu
PY - 1993/1
Y1 - 1993/1
N2 - Using a Laboratory XAFS(X-ray absorption fine structure) spectrometer, the local structure of aluminium in an aluminosilicate with a Si/Al atomic ratio of 1/3 was studied. From the XAFS data, the average Al-0 interatomic distance and coordination number of aluminium atoms were estimated. In addition, the assignment of the XANES(X-ray absorption nearedge structure) spectra for aluminium was discussed based on the27A1 MAS NMR spectra of the corresponding samples.
AB - Using a Laboratory XAFS(X-ray absorption fine structure) spectrometer, the local structure of aluminium in an aluminosilicate with a Si/Al atomic ratio of 1/3 was studied. From the XAFS data, the average Al-0 interatomic distance and coordination number of aluminium atoms were estimated. In addition, the assignment of the XANES(X-ray absorption nearedge structure) spectra for aluminium was discussed based on the27A1 MAS NMR spectra of the corresponding samples.
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U2 - 10.7567/JJAPS.32S2.670
DO - 10.7567/JJAPS.32S2.670
M3 - Article
AN - SCOPUS:33748410101
SN - 0021-4922
VL - 32
SP - 670
EP - 672
JO - Japanese journal of applied physics
JF - Japanese journal of applied physics
ER -