TY - JOUR
T1 - Angular dependence of critical current properties in YBCO coated tape under high magnetic field up to 18 T
AU - Kiss, T.
AU - Inoue, M.
AU - Nishimura, S.
AU - Kuga, T.
AU - Matsushita, T.
AU - Iijima, Y.
AU - Kakimoto, K.
AU - Saitoh, T.
AU - Awaji, S.
AU - Watanabe, K.
AU - Shiohara, Y.
N1 - Funding Information:
This work was supported by the New Energy and Industrial Technology Development Organization (NEDO) as Collaborative Research and Development of Fundamental Technologies for Superconductivity Applications.
Copyright:
Copyright 2008 Elsevier B.V., All rights reserved.
PY - 2002/10
Y1 - 2002/10
N2 - Critical current properties in a YBCO coated tape have been studied as a function of temperature, magnetic field and field angle under high magnetic field up to 18 T. 1 μm thick YBCO film was deposited on a bi-axially aligned Y2O3/YSZ/Hastelloy substrate fabricated by the IBAD technique. The value of critical current, Ic, of the 1 cm wide tape reached as high as 85 A at 77 K in self-field condition. After etching the tape into 100 μm wide and 1 mm long bridge, we measured extended E-J characteristics. The value of critical current density, Jc, is maintained higher than 105 A/cm2 at 70 K in 5 T perpendicular to the tape surface. Moreover, the power index n and the so called glass-liquid transition field, BGL, of the tape in perpendicular field are superior to those of epitaxial film deposited on a SrTiO3 single crystalline substrate. Jc vs. angle relationship shows broad peak around 90° where field is perpendicular to the tape surface, in addition to a sharp peak at 0°. These results suggest that the tape is highly uniform and correlated defects along c-axis direction contribute to flux pinning.
AB - Critical current properties in a YBCO coated tape have been studied as a function of temperature, magnetic field and field angle under high magnetic field up to 18 T. 1 μm thick YBCO film was deposited on a bi-axially aligned Y2O3/YSZ/Hastelloy substrate fabricated by the IBAD technique. The value of critical current, Ic, of the 1 cm wide tape reached as high as 85 A at 77 K in self-field condition. After etching the tape into 100 μm wide and 1 mm long bridge, we measured extended E-J characteristics. The value of critical current density, Jc, is maintained higher than 105 A/cm2 at 70 K in 5 T perpendicular to the tape surface. Moreover, the power index n and the so called glass-liquid transition field, BGL, of the tape in perpendicular field are superior to those of epitaxial film deposited on a SrTiO3 single crystalline substrate. Jc vs. angle relationship shows broad peak around 90° where field is perpendicular to the tape surface, in addition to a sharp peak at 0°. These results suggest that the tape is highly uniform and correlated defects along c-axis direction contribute to flux pinning.
UR - http://www.scopus.com/inward/record.url?scp=0012665745&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0012665745&partnerID=8YFLogxK
U2 - 10.1016/S0921-4534(02)01720-3
DO - 10.1016/S0921-4534(02)01720-3
M3 - Article
AN - SCOPUS:0012665745
SN - 0921-4534
VL - 378-381
SP - 1113
EP - 1117
JO - Physica C: Superconductivity and its applications
JF - Physica C: Superconductivity and its applications
IS - PART 2
ER -