Abstract
This study presents diffusion experiments of NiAl coupled with pure Ni (Ni/NiAl). The couple produces the Ni3Al-based intermetallic phase (γ' phase) as an intermediate layer at the interface during diffusion annealing. Analytical electron microscopy is used to examine microstructural features, crystallographic orientation and compositional variations across the interface. Interdiffusivities are measured from the compositional variations. It is shown that the growing behavior of the γ' phase changes between higher and lower annealing temperatures. The growth kinetics of the γ' phase is also discussed.
Original language | English |
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Pages (from-to) | 229-241 |
Number of pages | 13 |
Journal | Interface Science |
Volume | 4 |
Issue number | 3-4 |
DOIs | |
Publication status | Published - Sept 1997 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Materials Science(all)
- Condensed Matter Physics