TY - JOUR
T1 - Analysis on the photovoltaic property of Si quantum dot-sensitized solar cells
AU - Seo, Hyunwoong
AU - Ichida, Daiki
AU - Uchida, Giichiro
AU - Kamataki, Kunihiro
AU - Itagaki, Naho
AU - Koga, Kazunori
AU - Shiratani, Masaharu
N1 - Funding Information:
This work was supported by MEXT KAKENHI Grant Number 211 10005.
Publisher Copyright:
© 2014, Korean Society for Precision Engineering and Springer-Verlag Berlin Heidelberg.
PY - 2014/2/1
Y1 - 2014/2/1
N2 - This work first introduced Si quantum dots (QDs) for QD-sensitized solar cells (QDSCs). However, the particle size of Si QDs, which had visible light absorption, was relatively large. The paint-type Si QDSC was proposed in this work because Si QDs could not penetrate into nano-porous TiO2 network. Si QDs were synthesized by multi-hollow plasma discharge CVD and mixed with TiO2 paste. For better performance, thickness of Si-TiO2 layer was varied by coating times and Si-TiO2 films were optically and electrically analyzed. As a result, 6 times screen printed Si-TiO2 film had the best performance with the smallest internal impedance and the highest photon to current efficiency.
AB - This work first introduced Si quantum dots (QDs) for QD-sensitized solar cells (QDSCs). However, the particle size of Si QDs, which had visible light absorption, was relatively large. The paint-type Si QDSC was proposed in this work because Si QDs could not penetrate into nano-porous TiO2 network. Si QDs were synthesized by multi-hollow plasma discharge CVD and mixed with TiO2 paste. For better performance, thickness of Si-TiO2 layer was varied by coating times and Si-TiO2 films were optically and electrically analyzed. As a result, 6 times screen printed Si-TiO2 film had the best performance with the smallest internal impedance and the highest photon to current efficiency.
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U2 - 10.1007/s12541-014-0343-8
DO - 10.1007/s12541-014-0343-8
M3 - Article
AN - SCOPUS:84911498314
SN - 2234-7593
VL - 15
SP - 339
EP - 343
JO - International Journal of Precision Engineering and Manufacturing
JF - International Journal of Precision Engineering and Manufacturing
IS - 2
ER -