TY - GEN
T1 - Analysis of local features for handwritten character recognition
AU - Uchida, Seiichi
AU - Liwicki, Marcus
N1 - Copyright:
Copyright 2010 Elsevier B.V., All rights reserved.
PY - 2010
Y1 - 2010
N2 - This paper investigates a part-based recognition method of handwritten digits. In the proposed method, the global structure of digit patterns is discarded by representing each pattern by just a set of local feature vectors. The method is then comprised of two steps. First, each of J local feature vectors of a target pattern is recognized into one of ten categories ("0"-"9") by the nearest neighbor discrimination with a large database of reference vectors. Second, the category of the target pattern is determined by the majority voting on the J local recognition results. Despite a pessimistic expectation, we have reached recognition rates much higher than 90% for the task of digit recognition.
AB - This paper investigates a part-based recognition method of handwritten digits. In the proposed method, the global structure of digit patterns is discarded by representing each pattern by just a set of local feature vectors. The method is then comprised of two steps. First, each of J local feature vectors of a target pattern is recognized into one of ten categories ("0"-"9") by the nearest neighbor discrimination with a large database of reference vectors. Second, the category of the target pattern is determined by the majority voting on the J local recognition results. Despite a pessimistic expectation, we have reached recognition rates much higher than 90% for the task of digit recognition.
UR - http://www.scopus.com/inward/record.url?scp=78149491437&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=78149491437&partnerID=8YFLogxK
U2 - 10.1109/ICPR.2010.479
DO - 10.1109/ICPR.2010.479
M3 - Conference contribution
AN - SCOPUS:78149491437
SN - 9780769541099
T3 - Proceedings - International Conference on Pattern Recognition
SP - 1945
EP - 1948
BT - Proceedings - 2010 20th International Conference on Pattern Recognition, ICPR 2010
T2 - 2010 20th International Conference on Pattern Recognition, ICPR 2010
Y2 - 23 August 2010 through 26 August 2010
ER -