Analysis of error due to exclusion of higher modes on complex permittivity measurement using waveguide with flange

Kouji Shibata; Osamu Hashimoto; Ramesh K. Pokharel

doi:10.1093/ietele/E88-C.1.139

Analysis of error due to exclusion of higher modes on complex permittivity measurement using waveguide with flange

Kouji Shibata, Osamu Hashimoto, Ramesh K. Pokharel

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

Abstract

In this letter, we discuss the measurement error due to the exclusion of the higher modes when a waveguide with a flange is inserted with lossy dielectric material. The reflection coefficient is calculated by a spectrum-domain approach (SDA). which uses only the dominant (TE₁₀) mode to realize a simplified nondestructive measurement of complex permittivity of lossy dielectric sheets. The analysis shows that the error due to the exclusion of the higher modes decreases as complex permittivity increases. Consequently, we have confirmed that a simplified measurement of complex permittivity is possible by a coverage limitation with the SDA, which excludes the higher modes.

Original language	English
Pages (from-to)	139-142
Number of pages	4
Journal	IEICE Transactions on Electronics
Volume	E88-C
Issue number	1
DOIs	https://doi.org/10.1093/ietele/E88-C.1.139
Publication status	Published - Jan 2005
Externally published	Yes

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

Access to Document

10.1093/ietele/E88-C.1.139

Cite this

@article{589226e473ae480ba33b0288ca3723b7,

title = "Analysis of error due to exclusion of higher modes on complex permittivity measurement using waveguide with flange",

abstract = "In this letter, we discuss the measurement error due to the exclusion of the higher modes when a waveguide with a flange is inserted with lossy dielectric material. The reflection coefficient is calculated by a spectrum-domain approach (SDA). which uses only the dominant (TE10) mode to realize a simplified nondestructive measurement of complex permittivity of lossy dielectric sheets. The analysis shows that the error due to the exclusion of the higher modes decreases as complex permittivity increases. Consequently, we have confirmed that a simplified measurement of complex permittivity is possible by a coverage limitation with the SDA, which excludes the higher modes.",

author = "Kouji Shibata and Osamu Hashimoto and Pokharel, {Ramesh K.}",

year = "2005",

month = jan,

doi = "10.1093/ietele/E88-C.1.139",

language = "English",

volume = "E88-C",

pages = "139--142",

journal = "IEICE Transactions on Electronics",

issn = "0916-8524",

publisher = "The Institute of Electronics, Information and Communication Engineers (IEICE)",

number = "1",

}

TY - JOUR

T1 - Analysis of error due to exclusion of higher modes on complex permittivity measurement using waveguide with flange

AU - Shibata, Kouji

AU - Hashimoto, Osamu

AU - Pokharel, Ramesh K.

PY - 2005/1

Y1 - 2005/1

N2 - In this letter, we discuss the measurement error due to the exclusion of the higher modes when a waveguide with a flange is inserted with lossy dielectric material. The reflection coefficient is calculated by a spectrum-domain approach (SDA). which uses only the dominant (TE10) mode to realize a simplified nondestructive measurement of complex permittivity of lossy dielectric sheets. The analysis shows that the error due to the exclusion of the higher modes decreases as complex permittivity increases. Consequently, we have confirmed that a simplified measurement of complex permittivity is possible by a coverage limitation with the SDA, which excludes the higher modes.

AB - In this letter, we discuss the measurement error due to the exclusion of the higher modes when a waveguide with a flange is inserted with lossy dielectric material. The reflection coefficient is calculated by a spectrum-domain approach (SDA). which uses only the dominant (TE10) mode to realize a simplified nondestructive measurement of complex permittivity of lossy dielectric sheets. The analysis shows that the error due to the exclusion of the higher modes decreases as complex permittivity increases. Consequently, we have confirmed that a simplified measurement of complex permittivity is possible by a coverage limitation with the SDA, which excludes the higher modes.

UR - http://www.scopus.com/inward/record.url?scp=27544496083&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=27544496083&partnerID=8YFLogxK

U2 - 10.1093/ietele/E88-C.1.139

DO - 10.1093/ietele/E88-C.1.139

M3 - Article

AN - SCOPUS:27544496083

SN - 0916-8524

VL - E88-C

SP - 139

EP - 142

JO - IEICE Transactions on Electronics

JF - IEICE Transactions on Electronics

IS - 1

ER -

Analysis of error due to exclusion of higher modes on complex permittivity measurement using waveguide with flange

Abstract

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Fingerprint

Cite this