TY - JOUR
T1 - Analysis of carrier traps in continuously operated 4,4′-bis[N-(1- naphthyl)-N-phenyl-amino]-biphenyl/tris(8-hydroxyquinoline)aluminum-based organic light-emitting diodes by thermally stimulated current measurement
AU - Nakahara, Makoto
AU - Minagawa, Masahiro
AU - Oyamada, Takahito
AU - Tadokoro, Toyoyasu
AU - Sasabe, Hiroyuki
AU - Adachi, Chihaya
PY - 2007/7/13
Y1 - 2007/7/13
N2 - We measured the reliability of two different organic light-emitting diodes (OLEDs) composed of indium tin oxide (ITO)/4,4′-bis[N-(1-naphthyl)-N- phenyl-amino]biphenyl (α-NPD)/tris(8-hydroxyquinoline)aluminum (Alq 3)/MgAg (two layer) or ITO/α-NPD/α-NPD:Alq3 (mixed layer)/Alq3/MgAg. Changes in the carrier trap distribution were estimated by thermally stimulated current (TSC) measurements. Improved device reliability was observed in the mixed-layer device. In the case of the two-layer device, the TSC peaks gradually changed depending on the duration of continuous operation, while the mixed device showed no change in its TSC spectra. These spectral differences indicate that the mixing of α-NPD and Alq3 occurs during the continuous operation in the two-layer device.
AB - We measured the reliability of two different organic light-emitting diodes (OLEDs) composed of indium tin oxide (ITO)/4,4′-bis[N-(1-naphthyl)-N- phenyl-amino]biphenyl (α-NPD)/tris(8-hydroxyquinoline)aluminum (Alq 3)/MgAg (two layer) or ITO/α-NPD/α-NPD:Alq3 (mixed layer)/Alq3/MgAg. Changes in the carrier trap distribution were estimated by thermally stimulated current (TSC) measurements. Improved device reliability was observed in the mixed-layer device. In the case of the two-layer device, the TSC peaks gradually changed depending on the duration of continuous operation, while the mixed device showed no change in its TSC spectra. These spectral differences indicate that the mixing of α-NPD and Alq3 occurs during the continuous operation in the two-layer device.
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U2 - 10.1143/JJAP.46.L636
DO - 10.1143/JJAP.46.L636
M3 - Article
AN - SCOPUS:34547829059
SN - 0021-4922
VL - 46
SP - L636-L639
JO - Japanese Journal of Applied Physics
JF - Japanese Journal of Applied Physics
IS - 25-28
ER -