An attempt to measure simultaneously molecular orientation and current-voltage characteristics in thin films

Takeshi Komino; Hiroyuki Tajima; Masaki Matsuda

doi:10.1016/j.tsf.2008.09.008

An attempt to measure simultaneously molecular orientation and current-voltage characteristics in thin films

Takeshi Komino, Hiroyuki Tajima, Masaki Matsuda

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

Abstract

To investigate the relationship between molecular orientation and current voltage (J-V) characteristics, molecular orientation and J-V characteristics have been simultaneously measured in some indium tin oxide (ITO)/X/Al structures. X were thin films fabricated from poly(3-hexylthiophene) (P3HT), coumarin6 dispersed in poly(N-vinylcarvazole), or biomolecular hemin (Hm). The results have shown that the orientation change of the P3HT chain causes a reproducible loop of the J-V characteristics in P3HT thin film, and that the peak observed in the J-V characteristics in Hm is associated with irreversible molecular orientation change.

Original language	English
Pages (from-to)	1358-1361
Number of pages	4
Journal	Thin Solid Films
Volume	517
Issue number	4
DOIs	https://doi.org/10.1016/j.tsf.2008.09.008
Publication status	Published - Dec 31 2008
Externally published	Yes

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Surfaces and Interfaces
Surfaces, Coatings and Films
Metals and Alloys
Materials Chemistry

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10.1016/j.tsf.2008.09.008

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title = "An attempt to measure simultaneously molecular orientation and current-voltage characteristics in thin films",

abstract = "To investigate the relationship between molecular orientation and current voltage (J-V) characteristics, molecular orientation and J-V characteristics have been simultaneously measured in some indium tin oxide (ITO)/X/Al structures. X were thin films fabricated from poly(3-hexylthiophene) (P3HT), coumarin6 dispersed in poly(N-vinylcarvazole), or biomolecular hemin (Hm). The results have shown that the orientation change of the P3HT chain causes a reproducible loop of the J-V characteristics in P3HT thin film, and that the peak observed in the J-V characteristics in Hm is associated with irreversible molecular orientation change.",

author = "Takeshi Komino and Hiroyuki Tajima and Masaki Matsuda",

note = "Funding Information: This work was supported by a Grant-in-Aid for Scientific Research on Priority Areas of Molecular Conductors (No. 15073207) from the ministry of Education, Culture, Sports, Science and Technology, Grant-in-Aid for Scientific Research (B: No. 18350070) from the Japan Society for the Promotion of Science, and Global COE Program for Chemistry Innovation.",

year = "2008",

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doi = "10.1016/j.tsf.2008.09.008",

language = "English",

volume = "517",

pages = "1358--1361",

journal = "Thin Solid Films",

issn = "0040-6090",

publisher = "Elsevier",

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T1 - An attempt to measure simultaneously molecular orientation and current-voltage characteristics in thin films

AU - Komino, Takeshi

AU - Tajima, Hiroyuki

AU - Matsuda, Masaki

N1 - Funding Information: This work was supported by a Grant-in-Aid for Scientific Research on Priority Areas of Molecular Conductors (No. 15073207) from the ministry of Education, Culture, Sports, Science and Technology, Grant-in-Aid for Scientific Research (B: No. 18350070) from the Japan Society for the Promotion of Science, and Global COE Program for Chemistry Innovation.

PY - 2008/12/31

Y1 - 2008/12/31

N2 - To investigate the relationship between molecular orientation and current voltage (J-V) characteristics, molecular orientation and J-V characteristics have been simultaneously measured in some indium tin oxide (ITO)/X/Al structures. X were thin films fabricated from poly(3-hexylthiophene) (P3HT), coumarin6 dispersed in poly(N-vinylcarvazole), or biomolecular hemin (Hm). The results have shown that the orientation change of the P3HT chain causes a reproducible loop of the J-V characteristics in P3HT thin film, and that the peak observed in the J-V characteristics in Hm is associated with irreversible molecular orientation change.

AB - To investigate the relationship between molecular orientation and current voltage (J-V) characteristics, molecular orientation and J-V characteristics have been simultaneously measured in some indium tin oxide (ITO)/X/Al structures. X were thin films fabricated from poly(3-hexylthiophene) (P3HT), coumarin6 dispersed in poly(N-vinylcarvazole), or biomolecular hemin (Hm). The results have shown that the orientation change of the P3HT chain causes a reproducible loop of the J-V characteristics in P3HT thin film, and that the peak observed in the J-V characteristics in Hm is associated with irreversible molecular orientation change.

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DO - 10.1016/j.tsf.2008.09.008

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SN - 0040-6090

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SP - 1358

EP - 1361

JO - Thin Solid Films

JF - Thin Solid Films

IS - 4

ER -

An attempt to measure simultaneously molecular orientation and current-voltage characteristics in thin films

Abstract

All Science Journal Classification (ASJC) codes

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