TY - GEN
T1 - A unified SVM algorithm for lifetime prolongation of thermally-overheated power devices in multi-level inverters
AU - Aly, Mokhtar
AU - Dousoky, Gamal M.
AU - Ahmed, Emad M.
AU - Shoyama, Masahito
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016
Y1 - 2016
N2 - This paper presents a unified space vector modulation (SVM) algorithm for lifetime prolongation of thermally-overheated power semiconductor devices in multilevel inverters. Thermal overheating is the main cause of shortened-lifetime and open-circuit faults of the devices. Power semiconductor devices are subjected to thermal overheating due to their ageing that results from continuous overloading and power cycling. Moreover, thermal overheating in high power devices may result from its degradation and faults in the cooling system. When a thermal overheating is detected in one of the power devices, the proposed algorithm is applied to relieve the overheated device and dangerous circumstances are avoided as a result. The proposed algorithm relies on using the redundancy property between switching states in multilevel inverters to continuously evaluate a cost function of the junction temperature of thermally-overheated device for all possible switching sequences set, then it identifies the optimal relieving switching sequence. The proposed unified SVM is general that can be applied to any multilevel inverter, and also is valid for switching devices, as well as DC-link capacitors. The proposed algorithm has been designed and validated by simulation and experimental prototypes of three-level T-type inverter.
AB - This paper presents a unified space vector modulation (SVM) algorithm for lifetime prolongation of thermally-overheated power semiconductor devices in multilevel inverters. Thermal overheating is the main cause of shortened-lifetime and open-circuit faults of the devices. Power semiconductor devices are subjected to thermal overheating due to their ageing that results from continuous overloading and power cycling. Moreover, thermal overheating in high power devices may result from its degradation and faults in the cooling system. When a thermal overheating is detected in one of the power devices, the proposed algorithm is applied to relieve the overheated device and dangerous circumstances are avoided as a result. The proposed algorithm relies on using the redundancy property between switching states in multilevel inverters to continuously evaluate a cost function of the junction temperature of thermally-overheated device for all possible switching sequences set, then it identifies the optimal relieving switching sequence. The proposed unified SVM is general that can be applied to any multilevel inverter, and also is valid for switching devices, as well as DC-link capacitors. The proposed algorithm has been designed and validated by simulation and experimental prototypes of three-level T-type inverter.
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U2 - 10.1109/ECCE.2016.7854801
DO - 10.1109/ECCE.2016.7854801
M3 - Conference contribution
AN - SCOPUS:85015358094
T3 - ECCE 2016 - IEEE Energy Conversion Congress and Exposition, Proceedings
BT - ECCE 2016 - IEEE Energy Conversion Congress and Exposition, Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2016 IEEE Energy Conversion Congress and Exposition, ECCE 2016
Y2 - 18 September 2016 through 22 September 2016
ER -