Abstract
A thin plastic scintillator is used as a trigger counter of charged particle spectrometers. Since its Compton edge is not clear, it is difficult to check up the thin plastic scintillator counters with a standard gamma-ray source. In this paper, a simple method is proposed to determine the Compton edge and the energy resolution of the thin plastic scintillator by fitting the simulated spectrum to the measured. The simulated spectrum was made with a Monte Carlo program considering geometries of the plastic scintillator. This technique was examined with the plastic scintillator having thickness of 2mm to 10mm.
Original language | English |
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Title of host publication | IEEE Nuclear Science Symposium and Medical Imaging Conference |
Editors | D. Merelli, J. Surget, M. Ulma |
Volume | 1 |
Publication status | Published - 2000 |
Event | 2000 IEEE Nuclear Science Symposium Conference Record - Lyon, France Duration: Oct 15 2000 → Oct 20 2000 |
Other
Other | 2000 IEEE Nuclear Science Symposium Conference Record |
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Country/Territory | France |
City | Lyon |
Period | 10/15/00 → 10/20/00 |
All Science Journal Classification (ASJC) codes
- Computer Vision and Pattern Recognition
- Industrial and Manufacturing Engineering