Abstract
In the past, deformation / fracture (D/F) characteristics, defined as load-deformation relationships until the materials are fractured, have been analyzed and evaluated on the surface from milli- to micro-scale. The D/F characteristics are affected by more than ten thousand micro-scale internal structures like air bubbles (pores), impurity particles and cracks in 1mm 3; therefore, it is required to analyze nano-scale D/F characteristics inside materials. In this paper, we propose an analysis method by obtaining displacement vectors of impurity particles from nano-order 3D-CT images. A problem of matching over ten thousand impurity particles between deformation is solved by a stratified matching.
Original language | English |
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Pages | 1979-1984 |
Number of pages | 6 |
DOIs | |
Publication status | Published - Dec 1 2009 |
Externally published | Yes |
Event | 35th Annual Conference of the IEEE Industrial Electronics Society, IECON 2009 - Porto, Portugal Duration: Nov 3 2009 → Nov 5 2009 |
Other
Other | 35th Annual Conference of the IEEE Industrial Electronics Society, IECON 2009 |
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Country/Territory | Portugal |
City | Porto |
Period | 11/3/09 → 11/5/09 |
All Science Journal Classification (ASJC) codes
- Control and Systems Engineering
- Electrical and Electronic Engineering