A new method to analyze density fluctuation by microwave reflectometry

Kouji Shinohara, Syun'ichi Shiraiwa, Katsumichi Hoshino, Yukitoshi Miura, Kazuaki Hanada, Hiroshi Toyama

Research output: Contribution to journalArticlepeer-review

11 Citations (Scopus)


The runaway phase phenomenon is a problem in reflectometry measurements. The change in the phase difference between the reflected wave and the reference one cannot be explained by the movement of the cut-off layer when the runaway phase phenomenon occurs. It is difficult to extract information of the density fluctuation from the data with the runaway phase. We show a model in which the runaway phase phenomenon comes from the wave scattered by the density fluctuations, and describe a new analysis method based on this model. The obtained results on plasma displacement and density fluctuation spectrum are presented.

Original languageEnglish
Pages (from-to)7367-7374
Number of pages8
JournalJapanese Journal of Applied Physics
Issue number12 A
Publication statusPublished - Dec 1997
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)


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