A model for quantitative evaluation of the magnetic field caused by eddy current interaction with a flaw in conductor plates

H. Bayani; I. Sasada

doi:10.1109/intmag.2005.1464341

A model for quantitative evaluation of the magnetic field caused by eddy current interaction with a flaw in conductor plates

H. Bayani, I. Sasada

Electrical Engineering Sciences

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	INTERMAG ASIA 2005
Subtitle of host publication	Digests of the IEEE International Magnetics Conference
Publisher	IEEE Computer Society
Pages	1815-1816
Number of pages	2
ISBN (Print)	0780390091, 9780780390096
DOIs	https://doi.org/10.1109/intmag.2005.1464341
Publication status	Published - 2005
Event	INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference - Nagoya, Japan Duration: Apr 4 2005 → Apr 8 2005

Publication series

Name	INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference

Other

Other	INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference
Country/Territory	Japan
City	Nagoya
Period	4/4/05 → 4/8/05

All Science Journal Classification (ASJC) codes

Engineering(all)

Access to Document

10.1109/intmag.2005.1464341

Cite this

Bayani, H., & Sasada, I. (2005). A model for quantitative evaluation of the magnetic field caused by eddy current interaction with a flaw in conductor plates. In INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference (pp. 1815-1816). Article GV 01 (INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference). IEEE Computer Society. https://doi.org/10.1109/intmag.2005.1464341

A model for quantitative evaluation of the magnetic field caused by eddy current interaction with a flaw in conductor plates. / Bayani, H.; Sasada, I.
INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference. IEEE Computer Society, 2005. p. 1815-1816 GV 01 (INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Bayani, H & Sasada, I 2005, A model for quantitative evaluation of the magnetic field caused by eddy current interaction with a flaw in conductor plates. in INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference., GV 01, INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference, IEEE Computer Society, pp. 1815-1816, INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference, Nagoya, Japan, 4/4/05. https://doi.org/10.1109/intmag.2005.1464341

Bayani H, Sasada I. A model for quantitative evaluation of the magnetic field caused by eddy current interaction with a flaw in conductor plates. In INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference. IEEE Computer Society. 2005. p. 1815-1816. GV 01. (INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference). doi: 10.1109/intmag.2005.1464341

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A model for quantitative evaluation of the magnetic field caused by eddy current interaction with a flaw in conductor plates

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All Science Journal Classification (ASJC) codes

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