A fast test pattern generation for large scale circuits

Yusuke Matsunaga, Masahiro Fujita

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)


This paper describes a fast test pattern generator for large combinational circuit refining existing algorithms, the system can detect testable faults and identify redundant faults more effectively and mor efficiently. Three major contributions are presented in the paper, which are a fast growing algorithm finding path controllers, circuit narrowing technique and global implication based on equivalence. These modifications are described in detail and experimental results using ISCAS benchmark circuits are shown.

Original languageEnglish
Pages (from-to)305-311
Number of pages7
JournalFujitsu Scientific and Technical Journal
Issue number3
Publication statusPublished - Sept 1993
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Human-Computer Interaction
  • Electrical and Electronic Engineering
  • Hardware and Architecture


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