TY - JOUR
T1 - A combined environmental straining specimen holder for high-voltage electron microscopy
AU - Takahashi, Yoshimasa
AU - Tanaka, Masaki
AU - Higashida, Kenji
AU - Yasuda, Kazuhiro
AU - Matsumura, Syo
AU - Noguchi, Hiroshi
N1 - Funding Information:
The authors are indebted to Dr. S. Ohta, Mr. M. Ohsaki, and Ms. M. Hori at JEOL Ltd. for their helpful advices on the design of the present holder system. Helpful discussions with Prof. I.M. Robertson at the University of Illinois are also acknowledged. The in situ TEM experiments in this work were conducted with the help by Dr. S. Ohta and Mr. M. Ohsaki at JEOL Ltd. and Dr. E. Tanaka, Mr. M. Honda, and Mr. S. Sadamatsu at Kyushu University. The major part of this study has been conducted as “Fundamental Research Project on Advanced Hydrogen Science” funded by New Energy and Industrial Technology Development Organization (NEDO).
PY - 2010/10
Y1 - 2010/10
N2 - A novel specimen holder that enables in situ observation of crack-tip deformation and/or fracture under a controlled environment is developed for a high-voltage electron microscope (HVEM). A window-type environmental cell (EC) that incorporates a uniaxial straining apparatus is built into a side-entry-type single-tilt specimen holder. The gas control in EC, straining apparatus design, limited field of view for crack-tip observation, and specimen preparation for the specimen holder are presented in detail. Experimental results successfully demonstrate that the developed specimen holder is quite useful for the dynamic observation of crack-tip deformation and/or fracture subjected to a hostile environment, such as hydrogen gas.
AB - A novel specimen holder that enables in situ observation of crack-tip deformation and/or fracture under a controlled environment is developed for a high-voltage electron microscope (HVEM). A window-type environmental cell (EC) that incorporates a uniaxial straining apparatus is built into a side-entry-type single-tilt specimen holder. The gas control in EC, straining apparatus design, limited field of view for crack-tip observation, and specimen preparation for the specimen holder are presented in detail. Experimental results successfully demonstrate that the developed specimen holder is quite useful for the dynamic observation of crack-tip deformation and/or fracture subjected to a hostile environment, such as hydrogen gas.
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U2 - 10.1016/j.ultramic.2010.07.011
DO - 10.1016/j.ultramic.2010.07.011
M3 - Article
C2 - 20696527
AN - SCOPUS:77956226821
SN - 0304-3991
VL - 110
SP - 1420
EP - 1427
JO - Ultramicroscopy
JF - Ultramicroscopy
IS - 11
ER -