3-D image-based mechanical simulation of aluminium foams: Effects of internal microstructure

Hiroyuki Toda, Masayuki Takata, Tomomi Ohgaki, Masakazu Kobayashi, Toshiro Kobayashi, Kentaro Uesugi, Koichi Makii, Yasuhiro Aruga

Research output: Contribution to journalReview articlepeer-review

22 Citations (Scopus)

Abstract

SR (Synchrotron radiation) X-ray microtomography has been utilized for the 3D characterization of microstructures in an aluminum foam. Volume tomographic data sets are converted into stereolithography tessellation language (STL) models to create 3-D finite-element simulation models. Both quasi-static and dynamic deformation and damage behaviours are investigated numerically, especially focussing on the effects of relatively small micro-pores inside cell wall materials. It has been fairly obvious that the existence of micro-pores and their spatial distribution pattern in cell materials would be a key issue to control the deformation and fracture behaviours. It has been also clarified that the stress wave propagation during the dynamic loading is prone to relatively uniform local stress elevation compared to the case of the static compression, thereby more extensive damage is predicted in the case of the dynamic loading due to the increase in volume sampled by an external loading. These results are in qualitative agreement with experimental observations. Overall, the approach taken in this study has provided highly effective ways to characterize microstructure/properties relationships in such highly heterogeneous materials.

Original languageEnglish
Pages (from-to)459-467
Number of pages9
JournalAdvanced Engineering Materials
Volume8
Issue number6
DOIs
Publication statusPublished - Jun 2006
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics

Fingerprint

Dive into the research topics of '3-D image-based mechanical simulation of aluminium foams: Effects of internal microstructure'. Together they form a unique fingerprint.

Cite this