Research output per year
Research output per year
- 1 - 50 out of 831 results
Search results
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2025
A screening test of GaN-HEMTs for improvement of breakdown voltage uniformity
Saito, W. & Nishizawa, S., May 2025, In: Microelectronics Reliability. 168, 115643.Research output: Contribution to journal › Article › peer-review
Open Access -
Demonstration of superior UIS robustness of 3300 V scaled IGBT by non-proportional scaling methods
Zhou, X., Saito, W. & Hiramoto, T., Mar 1 2025, In: Japanese Journal of Applied Physics. 64, 3, 034001.Research output: Contribution to journal › Article › peer-review
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Improvement of sensitivity for power cycle degradation by a new device structure
Okame, K., Yamakita, Y., Nishizawa, S. & Saito, W., May 2025, In: Microelectronics Reliability. 168, 115713.Research output: Contribution to journal › Article › peer-review
Open Access -
Influence of Intrinsic Point Defects Incorporated from Growth Surface on Atomic Interdiffusion and Unintentional Compositional Gradient in AlGaN/AlN Heterointerfaces
Kangawa, Y., Kusaba, A., Kawamura, T., Kempisty, P., Ishisone, K. & Boero, M., Feb 5 2025, In: Crystal Growth and Design. 25, 3, p. 740-746 7 p.Research output: Contribution to journal › Article › peer-review
Open Access1 Citation (Scopus) -
2024
Adjacent vertebral fractures in the lumbar and thoracic spine after balloon kyphoplasty: A finite element analysis
Yamaguchi, Y., Kobayashi, T., Todo, M., Hijikata, Y., Mawatari, M., Tsukamoto, M., Yoshihara, T., Hirata, H. & Morimoto, T., Apr 26 2024, In: Medicine (United States). 103, 17, p. E37912Research output: Contribution to journal › Article › peer-review
Open Access -
A Future Outlook of Power Devices from the Viewpoint of Power Electronics Trends
Saito, W., Mar 1 2024, In: IEEE Transactions on Electron Devices. 71, 3, p. 1356-1364 9 p.Research output: Contribution to journal › Article › peer-review
7 Citations (Scopus) -
A Model of Wafer Warpage for Trench Field-Plate Power MOSFETs
Kato, H., Cai, B., Yuan, J., Miyamura, Y., Nishizawa, S. & Saito, W., Oct 2024, In: Physica Status Solidi (A) Applications and Materials Science. 221, 20, 2400264.Research output: Contribution to journal › Article › peer-review
Open Access1 Citation (Scopus) -
Augmentation of the electron counting rule with Ising model
Kawka, K., Kempisty, P. T., Sakowski, K., Krukowski, S., Boćkowski, M., Bowler, D. & Kusaba, A., Jun 14 2024, In: Journal of Applied Physics. 135, 22, 225302.Research output: Contribution to journal › Article › peer-review
Open Access1 Citation (Scopus) -
Digital Active Gate Driving Automatically Minimizing Switching Loss While Keeping Surge Current Below User-Specified Target
Inuma, T., Zhang, D., Hata, K., Mikami, K., Hatori, K., Tanaka, K., Saito, W. & Takamiya, M., 2024, 2024 IEEE 10th International Power Electronics and Motion Control Conference, IPEMC 2024 ECCE Asia. Institute of Electrical and Electronics Engineers Inc., p. 2372-2377 6 p. (2024 IEEE 10th International Power Electronics and Motion Control Conference, IPEMC 2024 ECCE Asia).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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Effect of solder junction void variation in power semiconductor package on power cycle lifetime
Onodera, H., Shishido, N., Asari, D., Isono, H. & Saito, W., Oct 2024, In: Microelectronics Reliability. 161, 115471.Research output: Contribution to journal › Article › peer-review
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Extraction and Characterization of Micro-fibrillated Cellulose from Rice Husk Waste for Biomedical Purposes
Nurhayati, Irianto, H. E., Riastuti, R., Pangesty, A. I., Nugraha, A. F., Todo, M., Jumahat, A. & Chalid, M., 2024, In: International Journal of Technology. 15, 2, p. 342-352 11 p.Research output: Contribution to journal › Article › peer-review
Open Access3 Citations (Scopus) -
IGBT ターンオフスイッチングにおけるサージ電圧解析
Translated title of the contribution :Analysis of Surge Voltage during Turn-Off Switching of IGBTs Research output: Contribution to journal › Article › peer-review
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Impact of p-Gate Contact in GaN-HEMTs on Overvoltage Stress Failure
Saito, W. & Nishizawa, S. I., Jun 1 2024, In: IEEE Transactions on Electron Devices. 71, 6, p. 3590-3595 6 p.Research output: Contribution to journal › Article › peer-review
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Mechanism of gate voltage spike under digital gate control at IGBT switching operations
Lou, Z., Mamee, T., Hata, K., Takamiya, M., Nishizawa, S. I. & Saito, W., Apr 2024, In: Power Electronic Devices and Components. 7, 100054.Research output: Contribution to journal › Article › peer-review
Open Access -
Numerical and experimental investigation of the effect of the solid-liquid interface shape on grown-in defects in a silicon single crystal
Suewaka, R., Saishoji, T. & Nishizawa, S. I., Mar 1 2024, In: Japanese journal of applied physics. 63, 3, 031006.Research output: Contribution to journal › Article › peer-review
Open Access -
Observation of Thermal-Resistance Increase of Degraded IGBT Modules by VCE(sat) Measurement in a Chopper Circuit
Hasegawa, K., Ueda, H., Hara, K., Shishido, N., Nakano, S., Saito, W. & Ninomiya, T., 2024, International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, PCIM Europe 2024. Mesago PCIM GmbH, p. 2997-3001 5 p. (PCIM Europe Conference Proceedings; vol. 2024-June).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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Overvoltage Failure Process of Cascode GaN Field Effect Transistors
Saito, W. & Nishizawa, S. I., Nov 2024, In: Physica Status Solidi (A) Applications and Materials Science. 221, 21, 2300791.Research output: Contribution to journal › Article › peer-review
Open Access1 Citation (Scopus) -
Paralleled SiC MOSFETs Circuit Breaker With a SiC MPS Diode for Avalanche Voltage Clamping
Takamori, T., Wada, K., Saito, W. & Nishizawa, S. I., 2024, In: IEEE Open Journal of Power Electronics. 5, p. 392-401 10 p.Research output: Contribution to journal › Article › peer-review
Open Access4 Citations (Scopus) -
Performance improvement of a standalone PV system using supercapacitors: modeling and energy management
Hassan, M. S., Hassan, S., Hassan, M. R. M., El-Sayed, A. H. M., Shoyama, M. & Dousoky, G. M., Mar 2024, In: International Journal of Power Electronics and Drive Systems. 15, 1, p. 222-238 17 p.Research output: Contribution to journal › Article › peer-review
Open Access1 Citation (Scopus) -
Proximal cementation of a collarless polished tapered hip stem: biomechanical analysis using a validated finite element model
Ling, C. S. Y., Izmin, A., Todo, M., Merican, A. M. & Chong, D. Y. R., Nov 2024, In: Medical and Biological Engineering and Computing. 62, 11, p. 3531-3542 12 p.Research output: Contribution to journal › Article › peer-review
1 Citation (Scopus) -
SiC Materials and Devices for Future Green Society
Nishizawa, S. I., 2024, IEEE Electron Devices Technology and Manufacturing Conference: Strengthening the Globalization in Semiconductors, EDTM 2024. Institute of Electrical and Electronics Engineers Inc., (IEEE Electron Devices Technology and Manufacturing Conference: Strengthening the Globalization in Semiconductors, EDTM 2024).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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Steady-State and dynamic characterization of proton exchange membrane fuel cell stack models using chaotic Rao optimization algorithm
Sultan, H. M., Menesy, A. S., Korashy, A., Hassan, M. S., Hassan, M. H., Jurado, F. & Kamel, S., Apr 2024, In: Sustainable Energy Technologies and Assessments. 64, 103673.Research output: Contribution to journal › Article › peer-review
7 Citations (Scopus) -
Study on stress in trench structures during silicon IGBTs process-oxidation
Cai, B., Yuan, J., Miyamura, Y., Saito, W. & Nishizawa, S. I., Mar 1 2024, In: Japanese journal of applied physics. 63, 3, 03SP16.Research output: Contribution to journal › Article › peer-review
Open Access -
Turn-off switching voltage surge analysis with dependence on IGBT cell design
Fujimoto, Y., Nishizawa, S. I. & Saito, W., Feb 29 2024, In: Japanese journal of applied physics. 63, 2, 02SP36.Research output: Contribution to journal › Article › peer-review
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2023
Adjustable Current Limiting Function with a Monolithically Integrated SiC Circuit Breaker Device
Takamori, T., Wada, K., Boettcher, N., Erlbacher, T., Saito, W. & Nishizawa, S. I., Sept 1 2023, In: IEEE Transactions on Industry Applications. 59, 5, p. 6427-6435 9 p.Research output: Contribution to journal › Article › peer-review
Open Access7 Citations (Scopus) -
A numerical analysis tool for the design of a TLP-based met mast
Tan, L., Liu, Y. & Hu, C., 2023, Proceedings of the 33rd International Ocean and Polar Engineering Conference, 2023. Chung, J. S., Wan, D., Yamaguchi, S., Yan, S., Buzin, I., Kawai, H., Liu, H., Kubat, I., Peng, B.-F., Reza, A., Sriram, V. & Van, S. H. (eds.). International Society of Offshore and Polar Engineers, p. 937-942 6 p. (Proceedings of the International Offshore and Polar Engineering Conference).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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A simple sensor device for power cycle degradation sensing
Tsukamoto, T., Nishizawa, S. I. & Saito, W., Aug 2023, In: Microelectronics Reliability. 147, 115068.Research output: Contribution to journal › Article › peer-review
1 Citation (Scopus) -
Automatic total performance design of low-voltage power MOSFETs using zoomed response surface method
Saito, W., Apr 1 2023, In: Japanese journal of applied physics. 62, SC, SC0803.Research output: Contribution to journal › Article › peer-review
Open Access -
Bond wire lift-off detection by gate voltage waveform in IGBT turn-off process enhanced by digital gate control
Mamee, T., Lou, Z., Hata, K., Takamiya, M., Nishizawa, S. I. & Saito, W., Oct 2023, In: Power Electronic Devices and Components. 6, 100052.Research output: Contribution to journal › Article › peer-review
Open Access1 Citation (Scopus) -
Deformation Induced by Magnetic Field on GaInSn Flow Surface
Hiraka, R., Al Salami, J., Tsugiki, T., Hanada, K. & Hu, C., 2023, In: Plasma and Fusion Research. 18, 2405083.Research output: Contribution to journal › Article › peer-review
Open Access -
Development of Self-Pulsatile hybrid cylindrical structure using human iPS cell-derived cardiomyocytes and polydimethylsiloxane
Kurita, H. & Todo, M., Jul 15 2023, In: Materials Letters. 343, 134373.Research output: Contribution to journal › Article › peer-review
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Device Design Direction of CSTBT for Low Loss and EMI Noise
Nishi, K., Konishi, K., Tadakuma, T., Furukawa, A. & Saito, W., Dec 1 2023, In: IEEE Transactions on Electron Devices. 70, 12, p. 6144-6150 7 p.Research output: Contribution to journal › Article › peer-review
2 Citations (Scopus) -
Effect of a Short, Bio-Mimetic Control Device on Aerodynamic Drag of Ahmed Body
Tran, T. H., Hijikuro, M., Anyoji, M., Uchida, T., Nakashima, T. & Shimizu, K., Mar 1 2023, In: Journal of Fluids Engineering, Transactions of the ASME. 145, 3, 031206.Research output: Contribution to journal › Article › peer-review
3 Citations (Scopus) -
Enhancement of turn-off gate voltage waveform change by digital gate control for bond wire lift-off detection in IGBT module
Mamee, T., Lou, Z., Hata, K., Takamiya, M., Nishizawa, S. I. & Saito, W., Aug 2023, In: Microelectronics Reliability. 147, 115067.Research output: Contribution to journal › Article › peer-review
3 Citations (Scopus) -
Evaluation of thermally activated defects behaviors in nitrogen-doped Czochralski silicon single crystals using deep level transient spectroscopy
Kajiwara, K., Eriguchi, K., Fusegawa, K., Mitsugi, N., Samata, S., Torigoe, K., Harada, K., Hourai, M. & Nishizawa, S. I., Jul 1 2023, In: Japanese journal of applied physics. 62, 7, 075504.Research output: Contribution to journal › Article › peer-review
Open Access1 Citation (Scopus) -
Failure Process of GaN-HEMTs by Repetitive Overvoltage Stress
Saito, W. & Nishizawa, S. I., 2023, 35th International Symposium on Power Semiconductor Devices and ICs, ISPSD 2023. Institute of Electrical and Electronics Engineers Inc., p. 84-87 4 p. (Proceedings of the International Symposium on Power Semiconductor Devices and ICs; vol. 2023-May).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
5 Citations (Scopus) -
Free-surface flow simulations with floating objects using lattice Boltzmann method
Watanabe, S., Kawahara, J., Aoki, T., Sugihara, K., Takase, S., Moriguchi, S. & Hashimoto, H., 2023, In: Engineering Applications of Computational Fluid Mechanics. 17, 1, 2211143.Research output: Contribution to journal › Article › peer-review
Open Access10 Citations (Scopus) -
IGBT Power Module Design for Suppressing Gate Voltage Spike at Digital Gate Control
Lou, Z., Mamee, T., Hata, K., Takamiya, M., Nishizawa, S. I. & Saito, W., 2023, In: IEEE Access. 11, p. 6632-6640 9 p.Research output: Contribution to journal › Article › peer-review
Open Access7 Citations (Scopus) -
Impact of Marangoni effect of oxygen on solid–liquid interface shape during Czochralski silicon growth applied with transverse magnetic field
Suewaka, R. & Nishizawa, S. I., Apr 1 2023, In: Journal of Crystal Growth. 607, 127123.Research output: Contribution to journal › Article › peer-review
Open Access8 Citations (Scopus) -
Implosion of a bubble pair near a solid surface
Yang, X., Liu, C., Li, J., Zhao, M. & Hu, C., Feb 2023, In: Physical Review Fluids. 8, 2, 023602.Research output: Contribution to journal › Article › peer-review
19 Citations (Scopus) -
Large-Current Output Digital Gate Driver for 6500 V, 1000 A IGBT Module to Reduce Switching Loss and Collector Current Overshoot
Horii, K., Yano, H., Hata, K., Wang, R., Mikami, K., Hatori, K., Tanaka, K., Saito, W. & Takamiya, M., Jul 1 2023, In: IEEE Transactions on Power Electronics. 38, 7, p. 8075-8088 14 p.Research output: Contribution to journal › Article › peer-review
7 Citations (Scopus) -
Mechanical evaluation of revision surgery for femoral shaft nonunion initially treated with intramedullary nailing: Exchange nailing versus augmentation plating
Mimata, H., Matsuura, Y., Yano, S., Ohtori, S. & Todo, M., Dec 2023, In: Injury. 54, 12, 111163.Research output: Contribution to journal › Article › peer-review
2 Citations (Scopus) -
Numerical and experimental investigation of effect of oxygen concentration on grown-in defects in a Czochralski silicon single crystal
Suewaka, R., Saishoji, T. & Nishizawa, S. I., Jul 1 2023, In: Japanese journal of applied physics. 62, 7, 071002.Research output: Contribution to journal › Article › peer-review
Open Access6 Citations (Scopus) -
Optimal 1+PDDF/FOPIT frequency regulator for developing robust multi-microgrid systems with employing EV energy storage batteries
Mohamed, E. A., Shawky, A., Almutairi, S. Z., Aly, M., Ahmed, E. M., Kandil, T. & Hassan, M. S., Dec 15 2023, In: Journal of Energy Storage. 73, 109088.Research output: Contribution to journal › Review article › peer-review
8 Citations (Scopus) -
Polar GaN Surfaces under Gallium Rich Conditions: Revised Thermodynamic Insights from Ab Initio Calculations
Kempisty, P., Kawka, K., Kusaba, A. & Kangawa, Y., Sept 1 2023, In: Materials. 16, 17, 5982.Research output: Contribution to journal › Article › peer-review
Open Access -
Reliability investigation of repeated unclamped inductive switching in a diode-clamped SiC circuit breaker
Takamori, T., Wada, K., Saito, W. & Nishizawa, S. I., Nov 2023, In: Microelectronics Reliability. 150, 115119.Research output: Contribution to journal › Article › peer-review
1 Citation (Scopus) -
Solid-State Circuit Breaker with Avalanche Robustness using Series-Connection of SiC Diodes
Takamori, T., Wada, K., Saito, W. & Nishizawa, S. I., 2023, ICPE 2023-ECCE Asia - 11th International Conference on Power Electronics - ECCE Asia: Green World with Power Electronics. Institute of Electrical and Electronics Engineers Inc., p. 3212-3216 5 p. (ICPE 2023-ECCE Asia - 11th International Conference on Power Electronics - ECCE Asia: Green World with Power Electronics).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
2 Citations (Scopus) -
Stability, Reliability, and Robustness of GaN Power Devices: A Review
Kozak, J. P., Zhang, R., Porter, M., Song, Q., Liu, J., Wang, B., Wang, R., Saito, W. & Zhang, Y., Jul 1 2023, In: IEEE Transactions on Power Electronics. 38, 7, p. 8442-8471 30 p.Research output: Contribution to journal › Article › peer-review
Open Access176 Citations (Scopus) -
The design considerations of stray inductance for power modules with parallel-connected IGBT chips for a digital gate driver control
Lou, Z., Mamee, T., Hata, K., Takamiya, M., Nishizawa, S. I. & Saito, W., Oct 2023, In: Power Electronic Devices and Components. 6, 100047.Research output: Contribution to journal › Article › peer-review
Open Access2 Citations (Scopus) -
The Study of Dislocation Propagation in Si Wafer during IGBT High Thermal Budget Process
Yuan, J., Miyamura, Y., Nakano, S., Saito, W. & Nishizawa, S. I., 2023, 7th IEEE Electron Devices Technology and Manufacturing Conference: Strengthen the Global Semiconductor Research Collaboration After the Covid-19 Pandemic, EDTM 2023. Institute of Electrical and Electronics Engineers Inc., (7th IEEE Electron Devices Technology and Manufacturing Conference: Strengthen the Global Semiconductor Research Collaboration After the Covid-19 Pandemic, EDTM 2023).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
2 Citations (Scopus)